{"id":997,"date":"2018-10-23T09:05:38","date_gmt":"2018-10-23T08:05:38","guid":{"rendered":"https:\/\/www.nanoworld.com\/blog\/?p=997"},"modified":"2023-04-18T12:59:41","modified_gmt":"2023-04-18T11:59:41","slug":"direct-afm-based-nanoscale-mapping-and-tomography-of-open-circuit-voltages-for-photovoltaics","status":"publish","type":"post","link":"https:\/\/www.nanoworld.com\/blog\/direct-afm-based-nanoscale-mapping-and-tomography-of-open-circuit-voltages-for-photovoltaics\/","title":{"rendered":"Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics"},"content":{"rendered":"

In the article cited below Katherine Atamanuk, Justin Luria and Bryan D. Huey present “a new approach for directly mapping VOC (open-circuit voltage) with nanoscale resolution, requiring a single, standard-speed AFM scan. This leverages the concept of the proportional-integral-derivative (PID) feedback loop that underpins nearly all AFM topography imaging.”*<\/p>\n

NanoWorld\u2122\u00a0Pointprobe\u00ae CDT-NCHR<\/a> conductive diamond coated silicon AFM probes were used in the described CT-AFM experiment.<\/p>\n

\"Supporting<\/a>
Supporting information for \u00abDirect AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics\u201d: Figure S1: Representative quasi-VOC* image from the measured photocurrent upon illumination during an applied voltage fixed at 700 mV.<\/figcaption><\/figure>\n

“Cadmium Telluride (CdTe) is an inexpensive thin-film photovoltaic with ca. 5% of the 2017 global market share for solar cells. To optimize the efficiency and reliability of these, or any electronic devices, a thorough understanding of their composition, microstructure, and performance is necessary as a function of device design, processing, and in-service conditions. Atomic force microscopy (AFM) has been a valuable tool for such characterization, especially of materials properties and device performance at the nanoscale. In the case of thin-film solar cells, local photovoltaic (PV) properties such as the open-circuit voltage, photocurrent, and work function have been demonstrated to vary by an order of magnitude, or more, within tens of nanometers […] Recently, property mapping with high spatial resolution by AFM has been further combined with the ability to serially mill a surface, in order to reveal underlying surface structures and uniquely develop three-dimensional (3D) nanoscale property maps. The most notable examples are based on pure current detection with the AFM to resolve conduction pathways in filamentary semiconducting devices and interconnects […], and tomographic AFM of photocurrents in polycrystalline solar cells during in situ illumination […].”*<\/p>\n

*Katherine Atamanuk, Justin Luria, Bryan D. Huey
\nDirect AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics<\/strong>
\nBeilstein Journal of Nanotechnology 2018, 9, 1802\u20131808.
\ndoi: 10.3762\/bjnano.9.171<\/p>\n

The article cited above is part of the Thematic Series “Scanning probe microscopy for energy-related materials”.<\/p>\n

Please follow this external link for the full article: https:\/\/www.beilstein-journals.org\/bjnano\/articles\/9\/171<\/a><\/p>\n

The article “Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics” by Atamanuk et. al is an Open Access article under the terms of the Creative Commons Attribution License (http:\/\/creativecommons.org\/licenses\/by\/4.0<\/a>), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.<\/p>\n","protected":false},"excerpt":{"rendered":"

In the article cited below Katherine Atamanuk, Justin Luria and Bryan D. Huey present “a new approach for directly mapping VOC (open-circuit voltage) with nanoscale resolution, requiring a single, standard-speed AFM scan. This leverages the concept of the proportional-integral-derivative (PID) feedback loop that underpins nearly all AFM topography imaging.”* NanoWorld\u2122\u00a0Pointprobe\u00ae CDT-NCHR conductive diamond coated silicon … Continue reading Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics<\/span><\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3],"tags":[8,17,112,107,36,35,113,34,109,108,16,110,13,111,37],"class_list":["post-997","post","type-post","status-publish","format-standard","hentry","category-news","tag-afm-probe","tag-atomic-force-microscopy","tag-cadmium-telluride","tag-cdt-nchr","tag-conductive-afm-tip","tag-conductive-diamond-coated-afm-tip","tag-ct-afm","tag-diamond-coated-afm-tip","tag-pcafm","tag-photo-conductive-afm","tag-scanning-probe-microscopy","tag-solar-cell","tag-spm-probes","tag-tomographic-afm","tag-wear-resistant-afm-tip"],"_links":{"self":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/997","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/comments?post=997"}],"version-history":[{"count":9,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/997\/revisions"}],"predecessor-version":[{"id":1007,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/997\/revisions\/1007"}],"wp:attachment":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/media?parent=997"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/categories?post=997"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/tags?post=997"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}