{"id":86,"date":"2004-08-01T12:28:09","date_gmt":"2004-08-01T12:28:09","guid":{"rendered":"https:\/\/nanoworld.com\/blog\/?p=86"},"modified":"2023-04-18T13:00:09","modified_gmt":"2023-04-18T12:00:09","slug":"product-announcement-for-august-2004","status":"publish","type":"post","link":"https:\/\/www.nanoworld.com\/blog\/product-announcement-for-august-2004\/","title":{"rendered":"PRODUCT ANNOUNCEMENT FOR AUGUST 2004"},"content":{"rendered":"<p><strong>HYBRID-NITRIDE AFM PROBES for Contact Mode are now available<\/strong><\/p>\n<p><!--more--><\/p>\n<div class=\"alignleft\" style=\"width: 280px;\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-89\" src=\"https:\/\/nanoworld.com\/blog\/wp-content\/uploads\/2004\/08\/HN-TipCloseUp-20110325020349.jpg\" alt=\"HN-TipCloseUp\" width=\"216\" height=\"172\" srcset=\"https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183011\/HN-TipCloseUp-20110325020349.jpg 216w, https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183011\/HN-TipCloseUp-20110325020349-50x40.jpg 50w\" sizes=\"auto, (max-width: 216px) 100vw, 216px\" \/><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-88\" src=\"https:\/\/nanoworld.com\/blog\/wp-content\/uploads\/2004\/08\/HN-Rectangular-CBs-20110325020340.jpg\" alt=\"HN-Rectangular-CBs\" width=\"216\" height=\"173\" srcset=\"https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183012\/HN-Rectangular-CBs-20110325020340.jpg 216w, https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183012\/HN-Rectangular-CBs-20110325020340-50x40.jpg 50w\" sizes=\"auto, (max-width: 216px) 100vw, 216px\" \/><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-91\" src=\"https:\/\/nanoworld.com\/blog\/wp-content\/uploads\/2004\/08\/HN-Triangular-CBs-20110325020301.jpg\" alt=\"HN-Triangular-CBs\" width=\"216\" height=\"173\" srcset=\"https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183009\/HN-Triangular-CBs-20110325020301.jpg 216w, https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183009\/HN-Triangular-CBs-20110325020301-50x40.jpg 50w\" sizes=\"auto, (max-width: 216px) 100vw, 216px\" \/><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-90\" src=\"https:\/\/nanoworld.com\/blog\/wp-content\/uploads\/2004\/08\/HN-3DSketch-20110325020317.jpg\" alt=\"HN-3DSketch\" width=\"216\" height=\"173\" srcset=\"https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183010\/HN-3DSketch-20110325020317.jpg 216w, https:\/\/dhipgo7nn2tea.cloudfront.net\/wp-content\/uploads\/2004\/08\/18183010\/HN-3DSketch-20110325020317-50x40.jpg 50w\" sizes=\"auto, (max-width: 216px) 100vw, 216px\" \/><\/div>\n<p><strong>General<\/strong><\/p>\n<ul>\n<li>contact mode SPM probe for wide range of applications<\/li>\n<li>fits to all well-known commercial SPMs<\/li>\n<li>silicon nitride cantilevers and tips<\/li>\n<li>cantilevers are supported by a holder chip made of SU-8 epoxy (hybrid design)<\/li>\n<li>suitable for operation in liquids<\/li>\n<\/ul>\n<p><strong>Material Features<\/strong><\/p>\n<ul>\n<li>low-stress silicon nitride for lowest cantilever bending<\/li>\n<li>excellent hardness for wear resistance and extended lifetime<\/li>\n<li>SU-8 epoxy allowing for single holder design<\/li>\n<\/ul>\n<p><strong>Cantilever<\/strong><\/p>\n<ul>\n<li>multi-lever design with two rectangular and two triangular cantilevers<\/li>\n<li>reflective chromium \/ titanium\/ gold coating on the backside of the cantilevers<\/li>\n<li>stress compensated with bending below 3\u00b0<\/li>\n<\/ul>\n<p><strong>Support Chip<\/strong><\/p>\n<ul>\n<li>made of SU-8 epoxy material (3.4mm x 1.5mm x 0.2mm)<\/li>\n<li>beveled corner design avoids mechanical contact between chip and sample<\/li>\n<li>notch design for clear indication of cantilever type (notch near triangular cantilevers)<\/li>\n<li>easy handling due to single holder chip<\/li>\n<\/ul>\n<p><strong>Tip<\/strong><\/p>\n<ul>\n<li>oxide sharpened pyramidal probe tip<\/li>\n<li>tip height 3.5 \u00b5m and tip radius of curvature typically &lt; 15 nm<\/li>\n<li>macroscopic half-cone angles 35\u00b0<\/li>\n<\/ul>\n<p><strong>Package sizes<\/strong><\/p>\n<ul>\n<li>20 and 50 probes<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>HYBRID-NITRIDE AFM PROBES for Contact Mode are now available<\/p>\n","protected":false},"author":3,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3],"tags":[],"class_list":["post-86","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/86","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/comments?post=86"}],"version-history":[{"count":3,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/86\/revisions"}],"predecessor-version":[{"id":93,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/86\/revisions\/93"}],"wp:attachment":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/media?parent=86"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/categories?post=86"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/tags?post=86"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}