{"id":3032,"date":"2025-11-10T09:53:09","date_gmt":"2025-11-10T08:53:09","guid":{"rendered":"https:\/\/www.nanoworld.com\/blog\/?p=3032"},"modified":"2025-11-10T09:55:01","modified_gmt":"2025-11-10T08:55:01","slug":"new-nanoworld-introduces-arrow-acr-silicon-afm-probe","status":"publish","type":"post","link":"https:\/\/www.nanoworld.com\/blog\/new-nanoworld-introduces-arrow-acr-silicon-afm-probe\/","title":{"rendered":"New – NanoWorld introduces Arrow-ACR Silicon AFM probe"},"content":{"rendered":"

A reliable replacement of the Olympus\u00ae<\/sup>* AC160 –
\nOptimized Positioning with Maximum AFM Tip Visibility<\/p>\n

NanoWorld AG is pleased to introduce the new Arrow-ACR<\/a> AFM probe, developed to provide research professionals worldwide with a dependable alternative to the discontinued Olympus\u00ae<\/sup>* AC160 microcantilever.<\/p>\n

The Arrow\u2122 ACR<\/a> (typical resonance frequency 300 kHz, typical force constant 26 N\/m), combines identical mechanical properties as the
\nOlympus\u00ae<\/sup>* AC160 with the well-known Arrow AFM tip and cantilever geometry<\/a>. Always positioned exactly at the end of the AFM cantilever, this AFM probe offers easy positioning of the AFM tip over the area of interest.<\/p>\n

With their moderate stiffness (typical force constant 26 N\/m) the Arrow\u2122 ACR<\/a> probes are particularly suitable for studying relatively soft materials, including various polymers. These AFM probes are designed to perform optimally in non-contact\/Tapping\u2122 mode in air, enabling detailed characterization of thin films, coatings, surface roughness, and localized defects.<\/p>\n

Users can expect stable operation, high sensitivity and high-speed scanning capabilities, ensuring reproducible data across a wide range of applications.<\/p>\n

For researchers seeking a seamless transition from the discontinued
\nOlympus\u00ae<\/sup>* AC160, the NanoWorld\u00ae <\/sup>Arrow\u2122 ACR<\/a> offers a reliable solution backed by NanoWorld\u2019s manufacturing precision and quality control.<\/p>\n

\"Product<\/a>
A reliable replacement of the Olympus\u00ae* AC160 – NanoWorld introduces new Arrow-ACR Silicon AFM probe
Optimized Positioning with Maximum AFM Tip Visibility<\/figcaption><\/figure>\n

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*Olympus\u00ae<\/sup> is a trademark of Olympus Corporation<\/p>\n","protected":false},"excerpt":{"rendered":"

A reliable replacement of the Olympus\u00ae* AC160 – Optimized Positioning with Maximum AFM Tip Visibility NanoWorld AG is pleased to introduce the new Arrow-ACR AFM probe, developed to provide research professionals worldwide with a dependable alternative to the discontinued Olympus\u00ae* AC160 microcantilever. The Arrow\u2122 ACR (typical resonance frequency 300 kHz, typical force constant 26 N\/m), … Continue reading New – NanoWorld introduces Arrow-ACR Silicon AFM probe<\/span><\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3],"tags":[1053,159,736,10,66,65,228,20,19,18,1051,649,1055,1056,424,15,76,802,1052,120,391,1054,21,425,230,343],"class_list":{"0":"post-3032","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"hentry","6":"category-news","7":"tag-ac160","8":"tag-afm-cantilevers","9":"tag-afm-characterization","10":"tag-afm-tips","11":"tag-afm","14":"tag-arrow-afm-cantilever","15":"tag-arrow-afm-probe","16":"tag-arrow-afm-tip","17":"tag-arrow-acr","18":"tag-characterization","19":"tag-dfm-mode","20":"tag-dynamic-mode","21":"tag-materials-research","22":"tag-microcantilevers","23":"tag-non-contact-afm","24":"tag-non-contact-mode","25":"tag-olympus","26":"tag-polymers","27":"tag-roughness","28":"tag-surface-roughness","29":"tag-tapping-mode","30":"tag-thin-films","31":"tag-230","32":"tag-343"},"_links":{"self":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/3032","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/comments?post=3032"}],"version-history":[{"count":5,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/3032\/revisions"}],"predecessor-version":[{"id":3038,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/3032\/revisions\/3038"}],"wp:attachment":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/media?parent=3032"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/categories?post=3032"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/tags?post=3032"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}