{"id":271,"date":"2015-06-22T07:00:55","date_gmt":"2015-06-22T07:00:55","guid":{"rendered":"https:\/\/nanoworld.com\/blog\/?p=271"},"modified":"2023-04-18T12:59:56","modified_gmt":"2023-04-18T11:59:56","slug":"nanoworld-pointprobe-high-aspect-ratio-tip-ar5-ar5t-screencast","status":"publish","type":"post","link":"https:\/\/www.nanoworld.com\/blog\/nanoworld-pointprobe-high-aspect-ratio-tip-ar5-ar5t-screencast\/","title":{"rendered":"NANOWORLD POINTPROBE\u00ae HIGH ASPECT RATIO TIP (AR5 \/ AR5T) SCREENCAST"},"content":{"rendered":"<p>Check out our\u00a0screencast about\u00a0NanoWorld Pointprobe\u00ae High Aspect Ratio\u00a0(AR5 \/ AR5T) Tip.<\/p>\n<p>It will give you an overview of our High Aspect Ratio\u00a0(AR5 \/ AR5T) tip\u00a0which has been developed for\u00a0measurements on samples with sidewall angles approaching 90\u00b0, e.g. deep trench measurements or other semiconductor applications.<\/p>\n<p><iframe loading=\"lazy\" title=\"NanoWorld Pointprobe\u00ae High Aspect Ratio Tip (AR5 \/ AR5T) Screencast\" width=\"660\" height=\"371\" src=\"https:\/\/www.youtube.com\/embed\/3his0ZDgmk0?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" referrerpolicy=\"strict-origin-when-cross-origin\" allowfullscreen><\/iframe><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Check out our\u00a0screencast about\u00a0NanoWorld Pointprobe\u00ae High Aspect Ratio\u00a0(AR5 \/ AR5T) Tip. It will give you an overview of our High Aspect Ratio\u00a0(AR5 \/ AR5T) tip\u00a0which has been developed for\u00a0measurements on samples with sidewall angles approaching 90\u00b0, e.g. deep trench measurements or other semiconductor applications. &nbsp;<\/p>\n","protected":false},"author":3,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3,2],"tags":[11,8,10,17,33,23,30,32,15,38,16,14,13,12,21,31],"class_list":["post-271","post","type-post","status-publish","format-standard","hentry","category-news","category-videos","tag-afm-cantilever","tag-afm-probe","tag-afm-tips","tag-atomic-force-microscopy","tag-deep-trench-measurment","tag-force-modulation-mode","tag-high-aspect-ratio-probes","tag-high-aspect-ratio-tips","tag-microcantilevers","tag-pointprobe","tag-scanning-probe-microscopy","tag-spm-cantilevers","tag-spm-probes","tag-spm-tips","tag-tapping-mode","tag-tilt-compensated-high-aspect-ratio-probes"],"_links":{"self":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/271","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/comments?post=271"}],"version-history":[{"count":1,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/271\/revisions"}],"predecessor-version":[{"id":272,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/271\/revisions\/272"}],"wp:attachment":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/media?parent=271"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/categories?post=271"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/tags?post=271"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}