{"id":1381,"date":"2019-07-29T02:49:15","date_gmt":"2019-07-29T01:49:15","guid":{"rendered":"https:\/\/www.nanoworld.com\/blog\/?p=1381"},"modified":"2023-04-18T12:59:25","modified_gmt":"2023-04-18T11:59:25","slug":"ultra-high-resolution-imaging-of-thin-films-and-single-strands-of-polythiophene-using-atomic-force-microscopy","status":"publish","type":"post","link":"https:\/\/www.nanoworld.com\/blog\/ultra-high-resolution-imaging-of-thin-films-and-single-strands-of-polythiophene-using-atomic-force-microscopy\/","title":{"rendered":"Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy"},"content":{"rendered":"\n

Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM).*

In the article \u201cUltra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy\u201d Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton show that individual thiophene units and the lattice of semicrystalline spin-coated films of polythiophenes (PTs) may be resolved using AFM under ambient conditions through the low-amplitude (\u2264\u20091\u2009nm) excitation of higher eigenmodes of a cantilever.*<\/p>\n\n\n\n

They\nauthors demonstrate that the use of higher eigenmodes\nin tapping-mode ambient AFM can be successfully employed to characterize both\nindividual polymer strands down to a single-atom level and also the ordering of\na semi-crystalline polymer with technological relevance. The combination of AFM\nand solution deposition provides a simple and high-resolution approach to\ncharacterizing the structure of polymers.*<\/p>\n\n\n\n

The use of NanoWorld Arrow-UHF<\/a> high frequency AFM probes at their first eigenmode of ~1.4\u2009MHz is mentioned.*<\/p>\n\n\n\n

\"\"

Figure 1a from “Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy” by V. Korolkov et al.: High-resolution AFM images of P3DT adsorbed on the surface of hBN. a An overview height scan of P3DT assembled on hBN, scan rate 6.51\u2009Hz, 1024\u2009\u00d7\u20091024\u2009px; inset shows lattice frequency shift image of hBN acquired in FM-AFM tapping mode, scan rate 39\u2009Hz, 512\u2009\u00d7\u2009512\u2009px; both images were acquired with the same Arrow UHF probe oscillating at fundamental frequency of 1.42\u2009MHz. <\/figcaption><\/figure>\n\n\n\n

*Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy<\/strong>
Nature Communications, volume 10, Article number: 1537 (2019)
doi: https:\/\/doi.org\/10.1038\/s41467-019-09571-6<\/p>\n\n\n\n

Please follow this external link to read the full article: <\/a>https:\/\/rdcu.be\/bLSdL<\/a><\/strong><\/p>\n\n\n\n

Open Access: The article \u00ab Ultra-high\nresolution imaging of thin films and single strands of polythiophene using\natomic force microscopy \u00bb by Vladimir V. Korolkov, Alex Summerfield, Alanna\nMurphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H.\nBeton is licensed under a Creative Commons Attribution 4.0 International\nLicense, which permits use, sharing, adaptation, distribution and reproduction\nin any medium or format, as long as you give appropriate credit to the original\nauthor(s) and the source, provide a link to the Creative Commons license, and\nindicate if changes were made. The images or other third party material in this\narticle are included in the article\u2019s Creative Commons license, unless\nindicated otherwise in a credit line to the material. If material is not\nincluded in the article\u2019s Creative Commons license and your intended use is not\npermitted by statutory regulation or exceeds the permitted use, you will need\nto obtain permission directly from the copyright holder. To view a copy of this\nlicense, visit http:\/\/creativecommons.org\/licenses\/by\/4.0\/.<\/p>\n\n\n\n

<\/p>\n","protected":false},"excerpt":{"rendered":"

Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM).* In the article \u201cUltra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy\u201d Vladimir … Continue reading Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy<\/span><\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3],"tags":[62,83,219,17,220,122,222,221,120,223,16,21],"class_list":["post-1381","post","type-post","status-publish","format-standard","hentry","category-news","tag-afm-probes","tag-arrow-uhf-afm-probe","tag-arrow-uhf","tag-atomic-force-microscopy","tag-high-frequency-afm-probes","tag-imaging-techniques","tag-molecular-self-assembly","tag-nanoscale-materials","tag-polymers","tag-polythiophene","tag-scanning-probe-microscopy","tag-tapping-mode"],"_links":{"self":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/1381","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/comments?post=1381"}],"version-history":[{"count":8,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/1381\/revisions"}],"predecessor-version":[{"id":1395,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/posts\/1381\/revisions\/1395"}],"wp:attachment":[{"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/media?parent=1381"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/categories?post=1381"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanoworld.com\/blog\/wp-json\/wp\/v2\/tags?post=1381"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}