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NanoWorld AFM Probes
Ultra-Short Cantilevers General Description
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General

  • especially designed for high speed scanning applications
  • cannot be used in all commercial SPMs and AFMs due to the small dimensions of the cantilevers
  • cantilever and tip are supported by a single crystal silicon support chip
  • no intrinsic stress and absolutely straight cantilevers

Cantilever

  • rectangular cantilever with rounded corners at the freestanding end
  • cantilever made of quartz-like material

Support Chip

  • dimensions of the silicon support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
  • etched and lowered corners of the support chip avoid contact between the support chip and the sample
  • alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the probes without major readjustment of the laser beam

Tip

  • nanotools® High Density Carbon/Diamond Like Carbon (HDC/DLC) tip
  • tip height typically 2.5 μm and radius of curvature typically < 10 nm  
  • tip aspect ratio typically 5:1 and tilt compensation of 8°
For detailed information about our AFM probe product series please see below:
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