SSS-NCH [fo: 320
kHz , C: 42 N/m
]
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology R
SSS-NCL [fo: 190
kHz , C: 48 N/m
] (long cantilever 225 µm) SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology R
SSS-SEIH [fo: 130
kHz , C: 15 N/m
] (for SEIKO AFMs) SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology R
For detailed information about our AFM probe product series please see below:
