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SuperSharpSilicon™ AFM Probes for High Resolution
Home ›  Probes Catalog ›  SuperSharpSilicon™ AFM Probes for High Resolution

[fo: 320 kHz , C: 42 N/m ]
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology

[fo: 190 kHz , C: 48 N/m ]
(long cantilever 225 µm)
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology

[fo: 130 kHz , C: 15 N/m ]
(for SEIKO AFMs)
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology
For detailed information about our AFM probe product series please see below:
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