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ALIGN Alignment chip suitable for all Pointprobe®, Diamond coated, High Aspect Ratio and SuperSharpSilicon™ Probes Order code: ALIGN-10 |
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H8 Height Standard for very precise z-calibration, nominal step height: 8 nm Order code: H8 |
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2D100 Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 100 nm pitch Order code: 2D100 |
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FLAT FLATNESS STANDARD for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10 nm on a 100x100 µm² area Order code: FLAT |
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2D200 Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200 nm pitch Order code: 2D200 |
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ESD kit Dissipative anti-static rubber mat, grounding wire 3 m in length, wristband Order code: ESD-KIT |
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2D300 Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 300 nm pitch Order code: 2D300 |
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Storage kit 10 NanoWorld antistatic standard GelPak® boxes with picking tweezers Order code: TS-KIT |
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For detailed information about our AFM Probe product series please see below:
 ARROW Pyrex-Nitride Pointprobe® Coatings
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