Electrical AFM Probes (EFM, SCM, Tuna, SSRM)
EFM [fo: 75 kHz, C: 2.8 N/m] Conductive Pointprobe® Silicon AFM Probe for Electrostatic Force Microscopy back and tip side: platinum iridium5 (PtIr5) coating Arrow NCPt [fo: 285 kHz, C: 42 N/m] Conductive Arrow™ Silicon AFM Probe silicon cantilever for Non-Contact / TappingMode back and tip side: platinum iridium5 (PtIr5) coating CDT-NCHR [fo: 320 kHz, C: 42 N/m] Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode tip side: conductive diamond coating backside: reflex coating NCHPt [fo: 320 kHz, C: 42 N/m] Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode back and tip side: platinum iridium5 (PtIr5) coating CDT-NCLR [fo: 190 kHz, C: 48 N/m] (long cantilever 225 µm) Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode tip side: diamond coating backside: reflex coating NCLPt [fo: 190 kHz, C: 48 N/m] (long cantilever 225 µm) Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode back and tip side: platinum iridium5 (PtIr5) coating CDT-FMR [fo: 75 kHz, C: 2.8 N/m] Conductive Diamond Coated Tip, silicon cantilever for Force Modulation Mode tip side: conductive diamond coating backside: reflex coating Arrow CONTPt [fo: 14 kHz, C: 0.2 N/m] Conductive Arrow™ Silicon AFM Probe silicon cantilever for Contact Mode back and tip side: platinum iridium5 (PtIr5) coating     CONTPt [fo: 13 kHz, C: 0.2 N/m] Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Contact Mode back and tip side: platinum iridium5 (PtIr5) coating For detailed information about our AFM Probe product series please see below: ARROW     Pyrex-Nitride     Pointprobe®     Coatings
Reflex coating: Aluminum coating for higher laser reflectivity		close window