Contact Mode AFM Probes (CONT) 
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Arrow CONT [fo: 14 kHz, C: 0.2 N/m] Arrow™ Silicon AFM Probe |
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ZEILR [fo: 27 kHz, C: 1.6 N/m] (for Zeiss Veritekt AFMs) Pointprobe® Silicon AFM Probe backside: reflex coating  |
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Arrow CONTR [fo: 14 kHz, C: 0.2 N/m] Arrow™ Silicon AFM Probe backside: reflex coating |
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CONTSC [fo: 23 kHz, C: 0.2 N/m] PointprobeŽ Silicon AFM Probe |
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CONT [fo: 13 kHz, C: 0.2 N/m] Pointprobe® Silicon AFM Probe |
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CONTSCR [fo: 23 kHz, C: 0.2 N/m] PointprobeŽ Silicon AFM Probe backside: reflex coating |
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CONTR [fo: 13 kHz, C: 0.2 N/m] Pointprobe® Silicon AFM Probe backside: reflex coating |
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PNP-DB Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short rectangular cantilevers backside: Chromium-Gold |
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PNP-TR Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short triangular cantilevers |
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For detailed information about our AFM Probe product series please see below: ARROW Pyrex-Nitride Pointprobe® Coatings |
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Reflex coating: Aluminum coating for higher laser reflectivityclose window