 |
 Type: LFM |
| Lateral force microscopy |
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NanoWorld Pointprobe® LFM probes are designed for lateral or friction force microscopy. This probe type is optimised for high sensitivity to lateral or friction forces due to an extremely soft, thin cantilever. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm. Additionally this probe offers typical tip radius of curvature of less than 8 nm. |
| Technical Data | Value | Range* |  |
| Thickness | 1 µm | 0.5 - 1.5 | |
| Mean Width | 48 µm | 42.5 - 52.5 | |
| Length | 225 µm | 220 - 230 | |
| Force Constant | 0.2 N/m | 0.02 - 0.7 | |
| Resonance Frequency | 23 kHz | 10 - 39 | |
| Order Code | Quantity | Data Sheet | |
| LFM-10 | 10 | yes | |
| LFM-20 | 20 | yes | |
| LFM-50 | 50 | no | |
| LFM-W | 380 | yes | |
* Typical values |
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For more information contact: info@nanoworld.com | |
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POINTPROBE® is a registered trademark of NANOWORLD AG TappingMode™ is a trademark of Digital Instruments Inc. GelPak® is a registered trademark of Vichem Corporation All data are subject to change without notice. |
NanoWorld AG Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchâtel Switzerland www.nanoworld.com |