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 Type: SEIHR |
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SEIKO INSTRUMENTS microscopes - Non-contact mode - High force constant - Reflex coating |
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NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm. The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever. |
| Technical Data | Value | Range* |  |
| Thickness | 5 µm | 4.5 - 5.5 | |
| Mean Width | 33 µm | 27.5 - 37.5 | |
| Length | 225 µm | 220 - 230 | |
| Force Constant | 15 N/m | 9 - 25 | |
| Resonance Frequency | 130 kHz | 110 - 150 | |
| Order Code | Quantity | Data Sheet | |
| SEIHR-10 | 10 | yes | |
| SEIHR-20 | 20 | yes | |
| SEIHR-50 | 50 | no | |
| SEIHR-W | 380 | yes | |
* Typical values |
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| Reflex Coating |
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| Reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. |
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For more information contact: info@nanoworld.com
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POINTPROBE® is a registered trademark of NANOWORLD AG TappingMode™ is a trademark of Digital Instruments Inc. GelPak® is a registered trademark of Vichem Corporation All data are subject to change without notice. |
NanoWorld AG Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchâtel Switzerland www.nanoworld.com |