Type: ZEIHR

ZEISS Veritekt microscopes - Non-contact mode High force constant - Reflex coating

NanoWorld Pointprobe® ZEIHR probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm. Additionally this probe offers typical tip radius of curvature of less than 8 nm. The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.

Technical Data	Value	Range*
Thickness	5 µm	4.5 - 5.5
Mean Width	57 µm	52.5 - 62.5
Length	225 µm	220 - 230
Force Constant	27 N/m	17 - 41
Resonance Frequency	130 kHz	110 - 150
Order Code	Quantity	Data Sheet
ZEIHR-10	10	yes
ZEIHR-20	20	yes
ZEIHR-50	50	no
ZEIHR-W	380	yes
* Typical values

Reflex Coating

Reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

For more information contact: info@nanoworld.com
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