NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.
The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectance of the cantilever. The typical tip radius of curvature is less than 25 nm.
| Cantilever Data | Value | Range* |
|---|---|---|
| Thickness | 7 µm | 6.5 - 7.5 |
| Mean Width | 38 µm | 33 - 43 |
| Length | 225 µm | 220 - 230 |
| Force Constant | 48 µm | 31 - 71 |
| Resonance Frequency | 190 kHz | 160 - 210 |
| Order Code | Quantity | Data Sheet |
|---|---|---|
| NCLPt-10 | 10 | yes |
| NCLPt-20 | 20 | yes |
| NCLPt-50 | 50 | no |
| NCLPt-W | 380 | yes |
| *Typical values | ||
