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NanoWorld AFM Probes
NanoWorld News for You
19-February-2014

NanoWorld AG introduces Ultra-Short Cantilevers for High-Speed Atomic Force Microscopy (HS-AFM)

Neuchâtel, February 19th 2014, NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM).
  . . . more

 

19-February-2014

New Product Screencast:
NanoWorld Ultra-Short Cantilevers (USC) for High Speed Scanning


Please watch the new product screencast on the NanoWorld Ultra-Short Cantilevers (USC) given by our Head of Product Development Mathieu Burri at www.youtube.com
. . . more

 

17-October-2011

NanoWorld appoints COO

Neuchâtel, October 17th 2011, Daniel Guntli, formerly the Assistant General Management, has joined NanoWorld AG’s management team as the new Chief Operating Officer.. . . . more

 

1-Jun-2011

NanoWorld AG announces High Speed Scanning AFM website

Neuchâtel, June 1 st 2011, NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM) at www.highspeedscanning.com. . . . more

 

23-Feb-2009

NanoWorld™ AFM probes brochure now available in ten languages

NanoWorld publishes its AFM and SPM probes product brochure in ten languages

Available in (click to view): 
. . . more

 

27-Nov-2007

NanoWorld™ introduces new Pyrex-Nitride AFM Probes

Neuchatel/Switzerland, November  27, 2007 NanoWorld today announced that it is extending its range of Pyrex-Nitride AFM probes. . . . more

 

14-Jun-2007

NanoWorld™ announces appointment of second South Korean Distributor
CnH TECH

Neuchâtel, June 14th, 2007 NanoWorld™ today announced that it has appointed CnH TECH as its second official distributor in South Korea . . . more

 

Jun-2006

PRODUCT INTRODUCTION FOR JUNE 2006:

PYREX-NITRIDE-SPM-PROBES are now available . . . more

 

Feb-2006

PRODUCT INTRODUCTION FOR JUNE 2006:

PYREX-NITRIDE-SPM-PROBES
Leading edge in sharpness and durability . . . more

 

27-Nov-2007

NanoWorld™ appoints NanoAndMore USA Corp. as its distributor for USA, Canada and Mexico

Neuchâtel, November 17th, 2005 NanoWorld™ has appointed NanoAndMore USA Corp. (NAM) as the official distributor of its line of probes for Atomic Force Microscopes (AFM) and Scanning Probe Microscopes (SPM) in the USA, Canada and Mexico (NAFTA). . . . more

 

05-Aug-2005

Change of address of our European Distributor NanoAndMore

Neuchâtel, August 5th 2005, Please note the change of address of our European Distributor NanoAndMore GmbH. . . . more

 

03-Aug-2005

NanoWorld™ appoints Canadian Distributor

Neuchâtel, August 3rd, 2005 NanoWorld™ has appointed Soquelec Ltd. as the official distributor of its line of probes for Atomic Force Microscopes (AFM) and Scanning Probe Microscopes (SPM) in Canada. . . . more

 

Aug-2004

PRODUCT ANNOUNCEMENT FOR AUGUST 2004:
HYBRID-NITRIDE AFM PROBES for Contact Mode are now available

. . . more

 

Feb-2004

PRODUCT ANNOUNCEMENT FOR AUGUST 2004:
HYBRID-NITRIDE™ SPM-SENSORS

Leading edge in sharpness and durability . . . more

 

01-Jan-2004

Change of address of our European Commercial Agent NanoAndMore

Neuchâtel, January 1st 2004, Please note the change of address of our European Commercial Agent NanoAndMore GmbH. . . . more

 

29-Dec-2003

Change of Address of our Korean Distributor Advanced Materials Solution

Neuchâtel, December 29th 2003, Please note the change of address of our Korean Distributor Advanced Materials Solution. . . . more

 

Aug-2003

PRODUCT ANNOUNCEMENT FOR JULY 2003:

ARROW SILICON SPM-SENSORS for Contact Mode and Force Modulation Mode are now available

For more detailed information please also refer to the Arrow Quick Selection Table.
. . . more

 

Jan-2003

NanoWorld™ appoints Korean Distributor

Neuchâtel, June 1st, 2003 NanoWorld™ announced that it has appointed Advanced Materials Solution as its official distributor in Korea.
This is a further step to expand NanoWorld's global presence with a distributor network that understands and satisfies our customers' needs and concerns.
. . . more

 

Mar-2003

NanoWorld AG appoints Key Account Manager for Semiconductor Applications

In an effort to expand NanoWorld's presence in the semiconductor industry Dr. Oliver Krause has been named key account manager for semiconductor applications . . . more

 

Mar-2003

NanoWorld AG appoints Head of Marketing

Neuchâtel, January 24. - NanoWorld AG is pleased to announce that it has strengthened its management team with the appointment of Ms. Michaela Roessger as head of the marketing department. This new function was created in connection with the acquisition of Nanoprobes by NanoWorld AG . . . more

 

Nov-2002

MORE STRENGTH, MORE OPPORTUNITIES

NanoWorld AG acquires NANOSENSORS GmbH & Co KG

The Announcement is also available for free download.

Neuchâtel, October 1. - With the acquisition of the assets from the German based NANOSENSORS GmbH & Co KG, NanoWorld AG expands its presence and market share in the SPM tip business and emphasizes its vision to be the leading global supplier for integrated solutions of nanotechnology in high technology applications within selected markets
. . . more

 

Nov-2002

PRODUCT ANNOUNCEMENT FOR DECEMBER 2002:

ARROW SILICON SPM-SENSORS (NON-CONTACT)

ARROW NC for non-contact/tapping mode available from December 2002: resonance frequency = 250kHz, force constant = 42 N/m cantilever length = 160µm, cantilever width (rectangular part) = 45µm . . . more

 

Mar-2003

Downloads

Our Product Guide and our Product Flyer are now available for free download. . . . more

 

Aug-2002

Conductive Diamond Tip CDT

For SPM applications that require hard contact between probe and sample we recommend our Diamond Coated Tip. . . . more

 

Jun-2002

Tilt Compensated High Aspect Ratio Tip AR5T

Our Tilt Compensated High Aspect Ratio Tip (AR5T) is similar to our High Aspect Ratio Tip (AR5). However, the high aspect ratio portion of the tip is tilted 13° with respect to the center axis of the tip. This compensates the tilt angle of the cantilever . . . more

 

Apr-2002

High Aspect Ratio Tip AR10

For measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications, we offer two different types of high aspect ratio tips showing near-vertical sidewalls . . . more

 

Dec-2001

CTI Project Cantilever-Based-SNOM-PROBE

NanoWorld AG is developping a cantilever-based SNOM probe, which will be produced using microfabrication techniques. This development project is supported by the Commission for technology and innovation (CTI) of the Swiss Federation . . . more

 

. . . more

 

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