USC mainly for dynamic mode applications in air
Nanotechnology is our field. Precision is our tradition.
Innovation is our key instrument.
That’s why we are located in Switzerland,
one of the most powerful and innovative areas in Europe.
Using our knowledge as well as our high precision SPM and AFM probes, our clients achieve the best results with Scanning Probe Microscopy (SPM) and with Atomic Force Microscopy (AFM).
The wide selection of tip shapes, spring constants, resonance frequencies and coatings translates to the most appropriate probe for your research as well as industrial applications.
The Pointprobe® Silicon AFM probes are the most widely used and best known AFM probes world-wide and have become the standard probes in many laboratories. The AFM probes of the Pointprobe® series are available in many different cantilever versions and tip shapes.
The AFM probes of the Arrow™ series feature a unique tip shape that allows easy positioning of the tip on the area of interest. The Arrow™ UHF version is designed for high speed scanning with a resonance frequency of up to 2 MHz.
With the Ultra-Short Cantilevers series NanoWorld now offers a whole range of AFM probes for High-Speed AFM. They are designed to resonate at frequen-cies of up to 5 MHz and feature a very wear resistant tip made of High Density Carbon/Diamond Like Carbon (HDC/DLC). Three different versions mainly for applications in air and three different versions mainly for applications in liquid are currently available.
The PNP Silicon Nitride AFM probes are available as versions with multiple triangular cantilevers, a version with a single triangular cantilever as well as a version with multiple rectangular cantilevers. They feature a pyramidal silicon nitride tip with a radius of curvature smaller than 10 nm. Tipless triangular silicon nitride cantilevers with either gold coating on the detector side or on both sides of the cantilevers are also available.