Pointprobe® Arrow™ Ultra-Short Cantilevers Pyrex-Nitride

QUICK SELECTION TABLE

Application Type Coating
Tip/Front Side
Coating Back Side Tip Shape Force Constant Resonance Frequency Cantilever Length x Width x Thickness
Contact Mode Contact Mode Arrow CONT - - Arrow™ 0.2 N/m 14 kHz 450 x 45 x 2 um
CONT - - Pointprobe® 0.2 N/m 13 kHz 450 x 50 x 2 μm
Arrow CONTR - Reflex (Al) Arrow™ 0.2 N/m 14 kHz 450 x 45 x 2 um
CONTR - Pointprobe® 0.2 N/m 13 kHz 450 x 50 x 2 μm
Arrow CONTPt PtIr5 PtIr5 Arrow™ 0.2 N/m 14 kHz 450 x 45 x 2 um
CONTPt Pointprobe® 0.2 N/m 13 kHz 450 x 50 x 2 μm
Contact Mode
(short cantilever)
CONTSC - - Pointprobe® 0.2 N/m 25 kHz 225 x 48 x 1 µm
CONTSCR - Reflex (Al)
Contact Mode/
TappingMode
Contact Mode or TappingMode PNP-TR
triangular
cantilevers
Cantilever 1 - Reflex (Au) Pyramidal silicon nitride 0.32 N/m 67 kHz 100 x 13.5 x 0.5 µm
Cantilever 2 0.08 N/m 17 kHz 200 x 28 x 0.5 µm
PNP-TR-Au triangular
cantilevers
Cantilever 1 Au 0.32 N/m 67 kHz 100 x 13.5 x 0.5 µm
Cantilever 2 0.08 N/m 17 kHz 200 x 28 x 0.5 µm
PNP-DB rectangular
cantilevers
Cantilever 1 - 0.48 N/m 67 kHz 100 x 40 x 0.5 µm
Cantilever 2 0.06 N/m 17 kHz 200 x 40 x 0.5 µm
High-Speed AFM Contact Mode
USC-F1.5-k0.6 Au (tip remains uncoated) Reflex (Au) Electron Beam Deposited (EBD) spike 0.6 N/m 1.5 MHz 7 x 3 x 0.10 µm
USC-F1.2-k0.15 0.15 N/m 1.2 MHz 7 x 2 x 0.08 µm
USC-F0.3-k0.3 0.3 N/m 0.3 MHz 20 x 10 x 0.19 µm
Non-Contact / TappingMode USC-F5-k30 Au (tip remains uncoated) Reflex (Au) Electron Beam Deposited (EBD) spike 30 N/m 5.0 MHz 10 x 5 x 0.68 µm
USC-F2-k3 3.0 N/m 2.0 MHz 10 x 5 x 0.28 µm
USC-F1.2-k7.3 7.3 N/m 1.2 MHz 20 x 10 x 0.67 µm
Arrow UHF - Reflex (Al) Arrow™ - up to
2.0 MHz
35 x 42 x 0.7 µm
Arrow UHF-AuD - Reflex (Au)
Non-Contact Mode /
TappingMode
Non-Contact / TappingMode
(high frequency)
Arrow NC - - Arrow™ 42 N/m 285 kHz 160 x 45 x 4.6 µm
NCH - - Pointprobe® 330 kHz 125 x 30 x 4 µm
Arrow NCR - Reflex (Al) Arrow™ 285 kHz 160 x 45 x 4.6 µm
NCHR - Reflex (Al) Pointprobe® 330 kHz 125 x 30 x 4 µm
Arrow NCPt PtIr5 PtIr5 Arrow™ 285 kHz 160 x 45 x 4.6 µm
NCHPt PtIr5 PtIr5 Pointprobe® 330 kHz 125 x 30 x 4 µm
SSS-NCH - - SuperSharpSilicon™
AR5-NCHR - Reflex (Al) High Aspect Ratio (5:1)
AR5T-NCHR (Tilt Compensated) - Reflex (Al)
AR10-NCHR - Reflex (Al) High Aspect Ratio (10:1)
DT-NCHR Diamond Reflex (Al) Diamond 80 N/m 400 kHz 125 x 30 x 4 µm
CDT-NCHR
Non-Contact /
Soft-TappingMode
NCST - - Pointprobe® 7.4 N/m 160 kHz 150 x 27 x 2.8 µm
NCSTR - Reflex (Al) Pointprobe®
Non-Contact / TappingMode (long cantilever) NCL - - Pointprobe® 48 N/m 190 kHz 225 x 38 x 7 µm
NCLR - Reflex (Al)
NCLPt PtIr5 Ptlr5
SSS-NCL - - SuperSharpSilicon™
AR5-NCLR - Reflex (Al) High Aspect Ratio (5:1)
DT-NCLR Diamond Reflex (Al) Diamond 72 N/m 210 kHz 225 x 38 x 7 µm
CDT-NCLR
Non-Contact / TappingMode (Seiko Non-Contact Mode) SEIHR - Reflex (Al) Pointprobe® 15 N/m 130 kHz 225 x 33 x 5 µm
SSS-SEIH - - SuperSharpSilicon™
Special Applications PeakForce Tapping™ ScanAsyst® Mode * PNP-TRS - Reflex (Au) Pyramidal silicon nitride 0.32 N/m 67 kHz 100 x 13.5 x 0.6 µm
Force Modulation Mode Arrow FM - - Arrow™ 2.8 N/m 75 kHz 240 x 35 x 3 µm
FM Pointprobe® 225 x 28 x 3 µm
Arrow FMR - Reflex (Al) Arrow™ 240 x 35 x 3 µm
FMR Pointprobe® 225 x 28 x 3 µm
DT-FMR Diamond Reflex (Al) Diamond 6.2 N/m 105 kHz 225 x 28 x 3 µm
CDT-FMR
Electrostatic Force Microscopy Arrow EFM PtIr5 Ptlr5 Arrow™ 2.8 N/m 75 kHz 240 x 35 x 3 µm
EFM Pointprobe® 225 x 28 x 3 µm
Magnetic Force Microscopy MFMR Hard magnetic Reflex (Al) Pointprobe® 2.8 N/m 75 kHz 225 x 28 x 3 µm
S-MFMR Soft magnetic
Tipless Cantilevers Arrow TL1 1 cantilever - - Tipless Silicon 0.03 N/m 6 kHz 500 x 100 x 1 µm
Arrow TL1-Au 1 cantilever Au -
Arrow TL2 Array of 2 cantilevers - -
Arrow TL2-Au Array of 2 cantilevers Au -
Arrow TL8 Array of 8 cantilevers - -
Arrow TL8-Au Array of 8 cantilevers Au -
PNP-TR-TL triangular
cantilevers
Cantilever 1 - Reflex (Au) Tipless Silicon Nitride 0.32 N/m 67 kHz 100 x 13.5 x 0.6 µm
Cantilever 2 0.08 N/m 17 kHz 200 x 28 x 0.6 µm
PNP-TR-TL-Au triangular
cantilevers
Cantilever 1 Au 0.32 N/m 67 kHz 100 x 13.5 x 0.6 µm
Cantilever 2 0.08 N/m 17 kHz 200 x 28 x 0.6 µm

For further information please visit our website at www.nanoworld.com. All data are subject to change. NanoWorld® and Pointprobe® are registered trademarks of NanoWorld AG.
* PeakForce Tapping™ and ScanAsyst® are registered trademarks of Bruker Corp.