NANOWORLD® SPM AND AFM PROBES

Nanotechnology is our field. Precision is our tradition.

 

 


POINTPROBE®

• most widely used and best known SPM and AFM probe world-wide

• silicon SPM and AFM probe for very high resolution imaging

• alignment grooves on back side of support chip

• tip radius typically < 8 nm

• guaranteed <12 nm

• available with different tip shapes

ULTRA-SHORT CANTILEVERS

• ultra-short cantilevers designed for High-Speed AFM

• 3 types with very high resonance frequencies (1.2 MHz - 5 MHz) and high force constants for dynamic mode applications in air

• 3 types with high resonance frequencies and low force constants (0.6 N/m – 0.15 N/m) mainly for applications in liquid

• wear resistant High Density Carbon/Diamond Like Carbon (HDC/DLC) tip

• tip radius typically < 10 nm

PYREX-NITRIDE

• silicon nitride cantilevers and tips

• designed for various imaging applications in contact mode or dynamic mode

• oxide sharpened pyramidal tips

• tip radius typically < 10 nm

• available either with triangular or rectangular cantilevers

• also available as tipless version

ARROW™

• optimized positioning through maximized tip visibility

• three sided tip defined by real crystal planes

• special tip shape leads to very symmetric scans

• tip at the very end of the cantilever

• tip radius typically < 10 nm, guaranteed <15 nm

• also available as high speed version with a resonance frequency of up to 2 MHz