NANOWORLD® SPM and AFM Probes

Nanotechnology is our field. Precision is our tradition.



Innovation is our key instrument.
That's why we are located in Switzerland,
one of the most powerful and innovative areas in Europe.



Using our knowledge as well as our high precision SPM and AFM Probes, our clients achieve the best results with Scanning Probe Microscopy (SPM) and particularly with Atomic Force Microscopy (AFM).



POINTPROBE®

Main Features

  • most widely used and best known SPM and AFM probe world-wide
  • silicon SPM and AFM probe for very high resolution imaging
  • alignment grooves on backside of support chip
  • tip radius typically < 8 nm
  • guaranteed <12 nm
  • available with different tip shapes

ARROW™

Main Features

  • optimized positioning through maximized tip visibility
  • three sided tip defined by
    real crystal planes
  • tip at the very end of the cantilever
  • tip radius typically < 10nm
  • guaranteed < 15 nm

PYREX-NITRIDE

Main Features

  • silicon nitride cantilevers and tips
  • pyrex-glass support chip
  • designed for various imaging applications in contact mode or dynamic mode
  • oxide sharpened pyramidal probe tips
  • tip radius typically < 10nm
  • available either with triangular or rectangular cantilevers