PRODUCT INTRODUCTION FOR JUNE 2006:

PYREX-NITRIDE-SPM-PROBES are now available

Tip Close Up 3D Sketch Rectangular Cantilevers Cantilevers Close Up		Leading edge in sharpness and durability
		The Announcement is also available for free download. General • SPM probe for a wide range of applications • Fits to all well-known commercial SPMs • Silicon nitride cantilevers and tips • Cantilevers are supported by a holder chip made of pyrex glass • Designed for various imaging applications in contact or dynamic mode Material Features • Low-stress silicon nitride for lowest cantilever bending • Excellent hardness for wear resistance and extended lifetime Cantilevers • multi-lever design with four rectangular cantilevers (version with triangular cantilevers to be introduced later this year) • reflective chromium / gold coating on the backside of the cantilevers • stress compensated with bending below 3° Holder • holder chips made of pyrex material (3.4 mm x 1.5 mm x 0.2 mm) • easy handling due to single holder chips Tip • oxide sharpened pyramidal probe tips • tip height 4 µm and tip radius of curvature typically < 15 nm • macrosocopic half-cone angles 35° UNIQUE FEATURES IN BRIEF: • single holder chips for easy handling • multi-lever design with four rectangular cantilevers (version with triangular cantilevers to be introduced later this year) Package sizes • 20 and 50 probes To request a free sample please download this form.