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High Aspect Ratio AFM Probes
Home ›  Probes Catalog ›  High Aspect Ratio AFM Probes
R
[fo: 320 kHz , C: 42 N/m ]
Silicon cantilever for Non-Contact / TappingMode, High Aspect Ratio Tip,
aspect ratio ≥ 5:1
backside: reflex coating
(optionally available without coating)
R
[fo: 190 kHz , C: 48 N/m ]
(long cantilever 225 µm)
Silicon cantilever for Non-Contact / TappingMode, High Aspect Ratio Tip,
aspect ratio ≥ 5:1
backside: reflex coating
(optionally available without coating)
R
[fo: 330 kHz , C: 42 N/m ]
Tilt Compensated High Aspect Ratio Probe
silicon cantilever for Non-Contact /
TappingMode, High Aspect Ratio Tip,
aspect ratio ≥ 5:1, tilt compensation 13°
backside: reflex coating
(optionally available without coating)
R
[fo: 320 kHz , C: 42 N/m ]
Silicon cantilever for Non-Contact / TappingMode, High Aspect Ratio Tip,
aspect ratio ≥ 10:1
backside: reflex coating
(optionally available without coating)
For detailed information about our AFM probe product series please see below:
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