EFM
[f_o: 75 kHz , C: 2.8 N/m ]
Conductive Pointprobe® Silicon AFM Probe for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating
R

NCHPt
[f_o: 320 kHz , C: 42 N/m ]
Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode
back and tip side:
platinum iridium5 (PtIr5) coating
R

Arrow EFM
[f_o: 75 kHz , C: 2.8 N/m ]
Conductive Arrow™ Silicon AFM Probe silicon cantilever for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating
R

Arrow NCPt
[f_o: 285 kHz , C: 42 N/m ]
Conductive Arrow™ Silicon AFM Probe silicon cantilever for Non-Contact / TappingMode
back and tip side:
platinum iridium5 (PtIr5) coating
R

CDT-NCHR
[f_o: 400 kHz , C: 80 N/m ]
Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode
tip side: conductive diamond coating
backside: reflex coating
R

CDT-NCLR
[f_o: 210 kHz , C: 72 N/m ]
(long cantilever 225 µm)
Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode
tip side: diamond coating
backside: reflex coating
R

CDT-FMR
[f_o: 105 kHz , C: 6.2 N/m ]
Conductive Diamond Coated Tip, silicon cantilever for Force Modulation Mode
tip side: conductive diamond coating
backside: reflex coating
R

NCLPt
[f_o: 190 kHz , C: 48 N/m ]
(long cantilever 225 µm)
Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode
back and tip side:
platinum iridium5 (PtIr5) coating
R

Arrow CONTPt
[f_o: 14 kHz , C: 0.2 N/m ]
Conductive Arrow™ Silicon AFM Probe silicon cantilever for Contact Mode
back and tip side:
platinum iridium5 (PtIr5) coating
R

CONTPt
[f_o: 13 kHz , C: 0.2 N/m ]
Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Contact Mode
back and tip side:
platinum iridium5 (PtIr5) coating
R