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Electrical AFM Probes (EFM, SCM, Tuna, SSRM)
Home › Probes Catalog › Non-Contact / Tapping Mode AFM Probes  › Electrical AFM Probes (EFM, SCM, Tuna, SSRM)

Platinum Irindium5 (Ptlr5) coated probes


[fo: 75 kHz , C: 2.8 N/m ]
Conductive Pointprobe® Silicon AFM Probe for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating

[fo: 320 kHz , C: 42 N/m ]
Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode
back and tip side:
platinum iridium5 (PtIr5) coating

[fo: 75 kHz , C: 2.8 N/m ]
Conductive Arrow™ Silicon AFM Probe silicon cantilever for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating

[fo: 285 kHz , C: 42 N/m ]
Conductive Arrow™ Silicon AFM Probe silicon cantilever for Non-Contact / TappingMode
back and tip side:
platinum iridium5 (PtIr5) coating

[fo: 14 kHz , C: 0.2 N/m ]
Conductive Arrow™ Silicon AFM Probe silicon cantilever for Contact Mode
back and tip side:
platinum iridium5 (PtIr5) coating

[fo: 13 kHz , C: 0.2 N/m ]
Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Contact Mode
back and tip side:
platinum iridium5 (PtIr5) coating

[fo: 190 kHz , C: 48 N/m ]

(long cantilever 225 µm)
Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode
back and tip side:
platinum iridium5 (PtIr5) coating

Conductive Diamond coated probes

R
[fo: 400 kHz , C: 80 N/m ]

Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode
tip side: conductive diamond coating
backside: reflex coating

R
[fo: 210 kHz , C: 72 N/m ]

(long cantilever 225 µm)
Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode
tip side: conductive diamond coating
backside: reflex coating

R
[fo: 105 kHz , C: 6.2 N/m ]

Conductive Diamond Coated Tip, silicon cantilever for Force Modulation Mode
tip side: conductive diamond coating
backside: reflex coating

For detailed information about our AFM probe product series please see below:
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