Type: Contact
Rotated, monolithic silicon AFM probe for contact mode applications;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
Consistent high quality at a lower price!
| Cantilever Data |
Value | Range* |
| Thickness |
2.0 µm | 1 - 3 |
| Mean Width |
50 µm | 45 - 55 |
| Length |
450 µm | 440 - 460 |
| Force Constant |
0.2 N/m | 0.07 - 0.4 |
| Resonance Frequency |
13 kHz | 9 - 17 |
| Order Code |
Quantity |
Data Sheet |
| Contact-10
| 10
| yes
|
| Contact-50
| 50
| yes
|
| Contact-W
| 380
| no
|
| *Typical values |
Pointprobe® is a registered trademark of NanoWorld AG
All data are subject to change without notice.
NanoWorld AG
Rue Jaquet-Droz 1
Case Postale 216
CH-2002 Neuchâtel
Switzerland
www.nanoworld.com
