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Contact Mode AFM Probes
Home ›  Products ›  Probes Catalog ›  Contact Mode AFM Probes
Arrow CONT
[fo: 14 kHz , C: 0.2 N/m ]
Arrow™ Silicon AFM Probe
Arrow CONTR
[fo: 14 kHz , C: 0.2 N/m ]
Arrow™ Silicon AFM Probe
backside: reflex coating
R
CONT
[fo: 13 kHz , C: 0.2 N/m ]
Pointprobe® Silicon AFM Probe
CONTR
[fo: 13 kHz , C: 0.2 N/m ]
Pointprobe® Silicon AFM Probe
backside: reflex coating
R
CONTSC
[fo: 23 kHz , C: 0.2 N/m ]
Pointprobe® Silicon AFM Probe
CONTSCR
[fo: 23 kHz , C: 0.2 N/m ]

Pointprobe® Silicon AFM Probe
backside: reflex coating


R
PNP-DB
[fo: 67 kHz , C: 0.48 N/m ]
[fo: 17 kHz , C: 0.06 N/m ]
Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode
measurement and biological samples,
two long and two short rectangular cantilevers
backside: Chromium-Gold
PNP-TR
[fo: 67 kHz , C: 0.32 N/m ]
[fo: 17 kHz , C: 0.08 N/m ]
Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode
measurement and biological samples,
two long and two short triangular cantilevers.
ZEILR
[fo: 27 kHz , C: 1.6 N/m ]
(for Zeiss Veritekt AFMs)
Pointprobe® Silicon AFM Probe
backside: reflex coating
R
For detailed information about our AFM probe product series please see below:
ARROW™ Pyrex-Nitride Pointprobe® Coatings
Member of NanoWorld Group