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Contact Mode AFM Probes
Home › Probes Catalog › Non-Contact / Tapping Mode AFM Probes  › Contact Mode AFM Probes

Long Cantilever (450µm) silicon contact mode probes


[fo: 13 kHz , C: 0.2 N/m ]
Pointprobe® Silicon AFM Probe
R
[fo: 13 kHz , C: 0.2 N/m ]
Pointprobe® Silicon AFM Probe
backside: reflex coating

[fo: 14 kHz , C: 0.2 N/m ]
Arrow™ Silicon AFM Probe
R
[fo: 14 kHz , C: 0.2 N/m ]
Arrow™ Silicon AFM Probe
backside: reflex coating
R
[fo: 27 kHz , C: 1.6 N/m ]
(for Zeiss Veritekt AFMs)
Pointprobe® Silicon AFM Probe
backside: reflex coating

Short Cantilever (225µm) silicon contact mode probes


[fo: 25 kHz , C: 0.2 N/m ]
Pointprobe® Silicon AFM Probe
R
[fo: 25 kHz , C: 0.2 N/m ]

Pointprobe® Silicon AFM Probe
backside: reflex coating

Silicon Nitride (SiN) contact mode probes


[fo: 17 kHz , C: 0.06 N/m ]
[fo: 67 kHz , C: 0.48 N/m ]
Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode
measurement and biological samples,
two long and two short rectangular cantilevers
backside: gold

[fo: 17 kHz , C: 0.08 N/m ]
[fo: 67 kHz , C: 0.32 N/m ]
Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode
measurement and biological samples,
two long and two short triangular cantilevers.
backside: gold
For detailed information about our AFM probe product series please see below:
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