ALIGN
Alignment chip suitable for all Pointprobe®, Diamond coated, High Aspect Ratio and SuperSharpSilicon™ Probes Order code: ALIGN-10 R
2D100
Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 100 nm pitch Order code: 2D100 R
2D200
Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200 nm pitch Order code: 2D200 R
2D300
Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 300 nm pitch Order code: 2D300 R
FLAT
FLATNESS STANDARD for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10 nm on a 100x100 µm² area Order code: FLAT R
ESD kit
Dissipative anti-static rubber mat, grounding wire 3 m in length, wristband Order code: ESD-KIT R
Storage kit
10 NanoWorld antistatic standard Gel-Pak® boxes with picking tweezers Order code: TS-KIT R
For detailed information about our AFM probe product series please see below: