Application Modes:

• Non-Contact / Tapping Mode AFM Probes
• Force Modulation Microscopy (FM) AFM Probes
• Contact Mode AFM Probes
• Silicon Nitride AFM Probes
• Ultra High Frequency High Speed Scanning Ultra Short Cantilevers AFM Probes
• High Aspect Ratio AFM Probes
• Diamond Coated AFM Tips
• Electrical AFM Probes (EFM, SCM, Tuna, SSRM)
• SuperSharpSilicon™ AFM Probes for High Resolution
• Magnetic Force Microscopy (MFM) AFM Probes
• Arrow™ Tipless Cantilevers and Cantilever Arrays
• Tipless Silicon Nitride Cantilevers

AFM probe properties: