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Non-Contact / Tapping Mode AFM Probes

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AFM probe properties:

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Search Results

65 results

NCHR R

[C = 42 N/m; fo = 320 kHz]

Pointprobe® Silicon AFM Probe
back side: reflex coating

Arrow™ NCR R

[C = 42 N/m; fo = 285 kHz]

Arrow™ Silicon AFM Probe
back side: reflex coating

NCLR R

[C = 48 N/m; fo = 190 kHz]

(long AFM cantilever 225 µm)
Pointprobe® Silicon AFM Probe
back side: reflex coating

NCSTR R

[C = 7.4 N/m; fo = 160 kHz]

Pointprobe® Silicon AFM Probe
back side: reflex coating

NCST

[C = 7.4 N/m; fo = 160 kHz]

Pointprobe® Silicon AFM Probe

Arrow™ FMR R

[C = 2.8 N/m; fo = 75 kHz]

Arrow™ Silicon AFM Probe
back side: reflex coating

FMR R

[C = 2.8 N/m; fo = 75 kHz]

Pointprobe® Silicon AFM Probe
back side: reflex coating

SSS-NCH

[C = 42 N/m; fo = 320 kHz]

SuperSharpSilicon™ AFM Probe, silicon AFM cantilever for Non-Contact / Tapping Mode with SuperSharpSilicon™ Tip
based on Pointprobe® technology

DT-NCHR R

[C = 80 N/m; fo = 400 kHz]

Diamond Coated AFM Tip, silicon AFM cantilever for Non-Contact / Tapping Mode
tip side: diamond coating
back side: reflex coating

DT-FMR R

[C = 6.2 N/m; fo = 105 kHz]

Diamond Coated AFM Tip, silicon AFM cantilever for Force Modulation Mode
tip side: diamond coating
back side: reflex coating

DT-NCLR R

[C = 72 N/m; fo = 210 kHz]

(long AFM cantilever 225 µm)
Conductive Diamond Coated AFM Tip, silicon AFM cantilever for Non-Contact / Tapping Mode
tip side: diamond coating
back side: reflex coating

CONTR R

[C = 0.2 N/m; fo = 13 kHz]

Pointprobe® Silicon AFM Probe
back side: reflex coating

Arrow™ CONTR R

[C = 0.2 N/m; fo = 14 kHz]

Arrow™ Silicon AFM Probe
back side: reflex coating

CDT-FMR R

[C = 6.2 N/m; fo = 105 kHz]

Conductive Diamond Coated AFM Tip, silicon AFM cantilever for Force Modulation Mode
tip side: conductive diamond coating
back side: reflex coating

Arrow™ EFM P

[C = 2.8 N/m; fo = 75 kHz]

Conductive Arrow™ Silicon AFM Probe, silicon AFM cantilever for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating

EFM P

[C = 2.8 N/m; fo = 75 kHz]

Conductive Pointprobe® Silicon AFM Probe for Electrostatic Force Microscopy
back and tip side:
platinum iridium5 (PtIr5) coating

Arrow™ UHFAuD G

[ fo = 2000 kHz]

Arrow™ Silicon AFM Probe, silicon AFM cantilever resonating with an Ultra High Frequency (UHF) of up to 2.0 MHz
back side: gold coating

USC-F1.2-k0.15 G

[C = 0.15 N/m; fo = 1200 kHz]

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid
tip side: gold (AFM tip remains uncoated)
back side: gold coating

PNP-TR G

[C1 = 0.32 N/m; fo1 = 67 kHz]
[C2 = 0.08 N/m; fo2 = 17 kHz]

Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short triangular AFM cantilevers
back side: gold coating

USC-F0.3-k0.3 G

[C = 0.3 N/m; fo = 300 kHz]

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid
tip side: gold (AFM tip remains uncoated)
back side: gold coating

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For detailed information about our AFM probe product series please see below: