 Application |
Type | Reflex Coating | Special | Forceconstant | Res. Frequency | |
 |
Contact mode | CONT | None or reflex | n.a. | 0.2 N/m | 13 kHz |
| Contact mode (Short Cantilever) | CONTSC | None or reflex | n.a. | 0.2 N/m | 25 kHz | |
| Contact mode, Seiko or Zeiss | ZEILR | Reflex | n.a. | 1.6 N/m | 27 kHz | |
 |
Non-contact / tapping mode (high frequency) |
NCH | None or reflex |
AR5, AR10, AR5T SSS, PtIr5, DT, CDT |
42 N/m | 330 kHz |
| Non-contact / soft tapping | NCST | None or reflex | n.a. | 7.4 N/m | 160 kHz | |
|
Non-contact / tapping mode (long cantilever) |
NCL | None or reflex | SSS, AR5, DT, CDT | 48 N/m | 190 kHz | |
|
Non-contact / tapping mode (Seiko non-contact mode) |
SEIHR | Reflex | SSS | 15 N/m | 130 kHz | |
 |
Force modulation mode | FM | None or reflex | DT, CDT | 2.8 N/m | 75 kHz |
| Electrostatic force microscopy | EFM | n.a. | n.a. | 2.8 N/m | 75 kHz | |
|
Magnetic force microscopy Hard magnetic (tipside) |
MFMR | Reflex | n.a. | 2.8 N/m | 75 kHz | |
| Magnetic force microscopy Soft magnetic (tipside) |
S-MFMR | Reflex | n.a. | 2.8 N/m | 75 kHz | |
All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.
In addition, special silicon SFM Probes can be designed and manufactured upon customer's request.
Please contact our development team.
SSS -> SuperSharpSilicon Tip :|: AR5 -> High Aspect Ratio Tip (5:1) :|: AR10 -> High Aspect Ratio Tip (10:1)
AR5T -> Tilt Compensated High Aspect Ratio Tip (5:1) :|: DT -> Diamond Coated Tip
CDT -> Conductive Diamond Coated Tip :|: PtIr5 -> Platinum Iridium 5 Coating :|: Reflex -> Aluminium Coating
